Insight
Electron and X-ray microscopy
- Insight issue:
- April 2009 Volume 8, No 4
Knowledge of the microscopic structure is essential for understanding the properties of materials and to design functional devices. Electron microscopy and X-ray imaging have been used for decades to 'look' inside matter. The articles in this Insight aim to illustrate some of the most outstanding advances in instrumentation and computation abilities of these techniques that have led to unprecedented precision in terms of spatial resolution and sensitivity to composition and physical properties.
Editorial
Electron and X-ray microscopy - p259
Fabio Pulizzi
doi:10.1038/nmat2424
Full text - Electron and X-ray microscopy | PDF (234KB) - Electron and X-ray microscopy
Commentary
Is science prepared for atomic-resolution electron microscopy? - pp260 - 262
Knut W. Urban
doi:10.1038/nmat2407
Full text - Is science prepared for atomic-resolution electron microscopy? | PDF (309KB) - Is science prepared for atomic-resolution electron microscopy?
Review Articles
Structure and bonding at the atomic scale by scanning transmission electron microscopy - pp263 - 270
David A. Muller
doi:10.1038/nmat2380
Abstract - Structure and bonding at the atomic scale by scanning transmission electron microscopy | Full text - Structure and bonding at the atomic scale by scanning transmission electron microscopy | PDF (836KB) - Structure and bonding at the atomic scale by scanning transmission electron microscopy
Electron tomography and holography in materials science - pp271 - 280
Paul A. Midgley & Rafal E. Dunin-Borkowski
doi:10.1038/nmat2406
Abstract - Electron tomography and holography in materials science | Full text - Electron tomography and holography in materials science | PDF (954KB) - Electron tomography and holography in materials science
Near-edge X-ray absorption fine-structure microscopy of organic and magnetic materials - pp281 - 290
Harald Ade & Herman Stoll
doi:10.1038/nmat2399
Abstract - Near-edge X-ray absorption fine-structure microscopy of organic and magnetic materials | Full text - Near-edge X-ray absorption fine-structure microscopy of organic and magnetic materials | PDF (1,106KB) - Near-edge X-ray absorption fine-structure microscopy of organic and magnetic materials
Coherent X-ray diffraction imaging of strain at the nanoscale - pp291 - 298
Ian Robinson & Ross Harder
doi:10.1038/nmat2400
Abstract - Coherent X-ray diffraction imaging of strain at the nanoscale | Full text - Coherent X-ray diffraction imaging of strain at the nanoscale | PDF (1,239KB) - Coherent X-ray diffraction imaging of strain at the nanoscale
Commentary
X-ray imaging beyond the limits - pp299 - 301
Henry N. Chapman
doi:10.1038/nmat2402
Full text - X-ray imaging beyond the limits | PDF (408KB) - X-ray imaging beyond the limits
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