The authors neglected to cite previous studies related to the control concepts of high speed atomic force microscopy in the Introduction section of this Article. These additional references are listed below as references 1 and 2, and should appear in the text as below.
“We propose a solution for a large range, high—speed system through simple modifications of a commercial system to move the sample with two different actuators in mechanical series and extending the control loop with model-based control for this scanner.”
should read:
“In line with the controls concepts introduced by Bozchalooi et al.1,2, we present a solution for a large range, high–speed system through simple modifications of a commercial system to move the sample with two different actuators in mechanical series and extending the control loop with model based control for this scanner.”
References
Soltani Bozchalooi, I., Youcef-Toumi, K., Burns, D. J. & Fantner, G. E. Compensator design for improved counterbalancing in high speed atomic force microscopy. The Review of scientific instruments 82 (11), 113712 (2011).
Soltani Bozchalooi, I. & Youcef-Toumi, K. Multi-actuation and PI control: a simple recipe for high-speed and large-range atomic force microscopy. Ultramicroscopy 146, 117–24 (2014).
Additional information
The online version of the original article can be found at 10.1038/srep11987
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Nievergelt, A., Erickson, B., Hosseini, N. et al. Correction: Corrigendum: Studying biological membranes with extended range high-speed atomic force microscopy. Sci Rep 6, 21654 (2016). https://doi.org/10.1038/srep21654
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DOI: https://doi.org/10.1038/srep21654
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