Abstract
Black phosphorus has emerged as a unique optoelectronic material, exhibiting tunable and high device performance from mid-infrared to visible wavelengths. Understanding the photophysics of this system is of interest to further advance device technologies based on it. Here we report the thickness dependence of the photoluminescence quantum yield at room temperature in black phosphorus while measuring the various radiative and non-radiative recombination rates. As the thickness decreases from bulk to ~4 nm, a drop in the photoluminescence quantum yield is initially observed due to enhanced surface carrier recombination, followed by an unexpectedly sharp increase in photoluminescence quantum yield with further thickness scaling, with an average value of ~30% for monolayers. This trend arises from the free-carrier to excitonic transition in black phosphorus thin films, and differs from the behaviour of conventional semiconductors, where photoluminescence quantum yield monotonically deteriorates with decreasing thickness. Furthermore, we find that the surface carrier recombination velocity of black phosphorus is two orders of magnitude lower than the lowest value reported in the literature for any semiconductor with or without passivation; this is due to the presence of self-terminated surface bonds in black phosphorus.
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Data availability
All data generated or analysed during this study are included in this published Article. Source data are provided with this paper.
Code availability
All codes to analyse the band structures, densities of states and optical properties are available from the corresponding authors upon reasonable request.
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Acknowledgements
This work was funded by the U.S. Department of Energy, Office of Science, Office of Basic Energy Sciences, Materials Sciences and Engineering Division under Contract No. DE-AC02-05-CH11231 (EMAT program KC1201). N.H. acknowledges support from the Postdoctoral Fellowships for Research Abroad of the Japan Society for the Promotion of Science. E.R. acknowledges support from the US Department of Energy, Office of Science, Office of Basic Energy Sciences, Materials Sciences and Engineering Division, under contract no. DE-AC02-05-CH11231 within the Fundamentals of Semiconductor Nanowire Program (KCPY23). The optical incoupling/outcoupling simulation performed in Australia was supported by the Australian Research Council Centre of Excellence for Transformative Meta-Optical Systems (project no. CE200100010) and by the Discovery Projects Program (DP210103428). We thank E. Yablonovitch for his help with carrier recombination modelling and S. Balendhran, H. Kim and N. Gupta for their help with optical measurements and simulations.
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N.H., S.Z.U. and A.J. conceived the idea for the project and designed the experiments. N.H., S.Z.U., I.K.M.R.R. and V.W. prepared samples and performed optical measurements. N.H., S.Z.U. and A.J. analysed the data. S.Z.U. performed analytical modelling. D.W. and E.R. performed electronic band structure calculations. N.H., S.Z.U., N.S.A., V.W. and K.B.C. performed optical simulations. N.H., S.Z.U. and A.J. wrote the paper. All authors discussed the results and commented on the paper.
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Higashitarumizu, N., Uddin, S.Z., Weinberg, D. et al. Anomalous thickness dependence of photoluminescence quantum yield in black phosphorous. Nat. Nanotechnol. 18, 507–513 (2023). https://doi.org/10.1038/s41565-023-01335-0
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DOI: https://doi.org/10.1038/s41565-023-01335-0
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