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An essential part of developing organic mixed ionic–electronic conducting materials and organic electrochemical transistors is consistent and standardized reporting of the product of charge carrier mobility and volumetric capacitance, the μC* product. This Comment argues that unexpected changes in transistor channel resistance can overestimate this figure of merit, leading to a confusion of comparisons in the literature.
In many concentrated alloys of current interest, the observation of diffuse superlattice intensities by transmission electron microscopy has been attributed to chemical short-range order. We briefly review these findings and comment on the plausibility of widespread interpretations, noting the absence of expected peaks, conflicts with theoretical predictions, and the possibility of alternative explanations.
The study of point defects in non-metallic crystals has become relevant for an increasing number of materials applications. Progress requires a foundation of consistent definitions and terminology. This Comment clarifies the underlying definitions of point defects, encourages the correct use of relative charge for their description and emphasizes their recognition as quasiparticles.
