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Safe practices for mobility evaluation in field-effect transistors and Hall effect measurements using emerging materials

Nature Electronics volume 7, pages 266–268 (2024)Cite this article

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Matters Arising to this article was published on 17 April 2024

The Original Article was published on 17 February 2022

arising from Liu, A. et al. Nature Electronics https://doi.org/10.1038/s41928-022-00712-2 (2022)

Accurate experimental determination of the charge carrier mobility (μ) is crucial for developing new electronic devices. Recently, Liu et al.1 reported perovskite field-effect transistors (FETs) based on solution-coated nanocrystalline CsSnI3 films, with field-effect mobilities (μFET) up to 55 cm2 V−1 s−1 and Hall effect measurements with mobilities (μHall) up to 486 cm2 V−1 s−1. However, several issues regarding the FET and Hall measurements suggest overestimated mobilities, in particular the nonlinear, noisy and hysteretic FET characteristics, a three-orders-of-magnitude disagreement between the Hall and FET carrier densities, and the high excitation current and Joule power densities applied in these devices.

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Fig. 1: Replotted and original transfer characteristics of the optimized CsSnI3 FET from ref. 1.

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The data that support the findings of this study are available from the corresponding author upon reasonable request.

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Acknowledgements

V.B. and V.P. acknowledge partial support for their research via the Donald H. Jacobs Chair in Applied Physics at Rutgers University.

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  1. Department of Physics, Rutgers University, Piscataway, NJ, USA

    Vitaly Podzorov & Vladimir Bruevich

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  1. Vitaly Podzorov
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V.B. and V.P. performed the analysis of the published data and wrote the manuscript.

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Correspondence to Vitaly Podzorov.

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Supplementary Discussion (Sections 1–3), with three equations and 15 references.

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Podzorov, V., Bruevich, V. Safe practices for mobility evaluation in field-effect transistors and Hall effect measurements using emerging materials. Nat Electron 7, 266–268 (2024). https://doi.org/10.1038/s41928-024-01154-8

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