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Atomic-scale machine learning for modelling memory devices

Machine-learning-driven atomistic simulations are shown to describe phase-change materials on the length scale of real devices. This demonstration suggests that the atomic-scale design of phase-change architectures, programming conditions and full devices could be within reach.

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Fig. 1: Device-scale modelling of the RESET process in PCMs.

References

  1. Zhang, W., Mazzarello, R., Wuttig, M. & Ma, E. Designing crystallization in phase-change materials for universal memory and neuro-inspired computing. Nat. Rev. Mater. 4, 150–168 (2021). A review article that presents current and future applications of PCMs and strategies for their computational design.

    Article  Google Scholar 

  2. Hegedüs, J. & Elliott, S. R. Microscopic origin of the fast crystallization ability of Ge–Sb–Te phase-change memory materials. Nat. Mater. 7, 399–405 (2008). This paper reports one of the early applications of quantum-mechanical simulations to PCMs.

    Article  Google Scholar 

  3. Deringer, V. L., Caro, M. A. & Csányi, G. Machine learning interatomic potentials as emerging tools for materials science. Adv. Mater. 31, 1902765 (2019). A progress report that focuses on the ways that ML potentials can be applied to materials.

    Article  Google Scholar 

  4. Sosso, G. C. et al. Neural network interatomic potential for the phase change material GeTe. Phys. Rev. B 85, 174103 (2012). This paper reports a ML potential for binary GeTe that enabled many subsequent applications.

    Article  Google Scholar 

  5. Cheng, H.-Y. et al. 3D cross-point phase-change memory for storage-class memory. J. Phys. D 52, 473002 (2019). A review article that discusses the use of PCMs in cross-point memory devices.

    Article  Google Scholar 

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This is a summary of: Zhou, Y. et al. Device-scale atomistic modelling of phase-change memory materials. Nat. Electron. https://doi.org/10.1038/s41928-023-01030-x (2023).

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Atomic-scale machine learning for modelling memory devices. Nat Electron 6, 726–727 (2023). https://doi.org/10.1038/s41928-023-01031-w

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