Abstract
Electrical manipulation and detection of antiferromagnetic order could be used to create reliable and fast spintronic memory devices. The state of antiferromagnets can be read out using signals such as the anisotropic magnetoresistance and anomalous Hall effect, but these signals remain low, which restricts device development. Here we report the electrical detection of antiferromagnetism in Pt/IrMn/CoFeB/MgO/CoFeB three-terminal magnetic tunnel junctions using tunnelling magnetoresistance. We measure a tunnelling magnetoresistance ratio of over 80%, which is achieved by imprinting the antiferromagnetic state of IrMn on the ferromagnetic CoFeB free layer. We show current-polarity-dependent switching of IrMn down to 0.8 ns and identify two switching mechanisms: a heat-driven mode and a spin–orbit-torque-driven mode. The dominant switching mechanism depends on the current pulse width. Numerical simulations suggest that the spin–orbit torque generated by Pt induces the precession of IrMn moments and that exchange coupling at the IrMn/CoFeB interface determines the switching polarity of IrMn.
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Data availability
The data that support the plots within this paper and the other findings of this study are available from the corresponding author upon reasonable request.
Code availability
The codes used in this paper are available from the corresponding author upon reasonable request.
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Acknowledgements
This work was supported by the National Key Research and Development Program of China (2022YFB4400200, W.Z.; 2022YFA1402604, D.Z.), National Natural Science Foundation of China (92164206, W.Z.; 62271026, K.S.; 62001014, K.C.; 52121001, W.Z.), National Postdoctoral Program for Innovative Talents (BX20220374, D.Z.) and Outstanding Research Project of Shenyuan Honors College (BUAA 230121102, A.D.) and the Tencent Foundation through the XPLORER PRIZE (W.Z.). We thank Y. Han (Center of Nanofabrication, Tsinghua University) for technical assistance.
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W.Z. initialized, conceived and supervised the project. Z.G. and S. Lu designed and optimized the MTJ stack. A.D., Z.G., R.X., J.Y. and C.Z. fabricated the devices under the guidance of K.C. and K.S. A.D., D.Z., Z.G., D.X. and W.C. performed the measurements. D.Z. and Z.Z. performed the numerical simulations, and S. Luo and A.F. analysed the results. A.D., D.Z., K.C., Z.Z., Z.G. and W.Z. wrote the manuscript. All authors discussed the results and commented on the manuscript.
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Du, A., Zhu, D., Cao, K. et al. Electrical manipulation and detection of antiferromagnetism in magnetic tunnel junctions. Nat Electron 6, 425–433 (2023). https://doi.org/10.1038/s41928-023-00975-3
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DOI: https://doi.org/10.1038/s41928-023-00975-3
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