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Scanning probe microscopy

Taking a closer look at conductivity

Nature Nanotechnology volume 6, pages 84–85 (2011)Cite this article

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The formation of an atomic-scale metal filament at the end of an atomic force microscope will pave the way for higher-resolution imaging by AFMs with functionalized tips.

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Figure 1: Hong, Cha and Cui increased the lateral resolution of a C-AFM tip by adding an atomic-scale metal filament to the tip of the AFM probe3.

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Authors and Affiliations

  1. Julie V. Macpherson is in the Department of Chemistry, University of Warwick, Coventry CV4 7AL, UK. j.macpherson@warwick.ac.uk.,

    Julie V. Macpherson

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  1. Julie V. Macpherson
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Macpherson, J. Taking a closer look at conductivity. Nature Nanotech 6, 84–85 (2011). https://doi.org/10.1038/nnano.2011.8

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