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Atomic motion in ferromagnetic break junctions

Nature Nanotechnology volume 2, pages 522–523 (2007)Cite this article

Authors' response

In their comment1, Shi and Ralph emphasize that conductance of Ni point contacts produced by an electromigration technique can occasionally exhibit two-level fluctuations (TLF), mimicking the discrete steps in the conductance of the point contacts as a function of the applied magnetic-field direction. They explain the nature of these steps in terms of atomic motion rather than intrinsic electronic effect. We emphasize in this reply that our results2, obtained on a different magnetic material synthesized by a different method, do not show any data confirming their hypothesis.

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References

  1. Shi, S. F. & Ralph, D. C. Nature Nanotech. advance online publication, 26 August 2007 (10.1038/nnano.2007.251).

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  2. Sokolov, A., Zhang, C., Tsymbal, E.Y., Redepenning, J. & Doudin, B. Nature Nanotech. 2, 171–175 (2007).

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  3. Kigushi, M., Konishi, T., & Murakoshi K., Appl. Phys. Lett. 87, 043104 (2005).

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Authors and Affiliations

  1. Department of Physics and Astronomy, University of Nebraska-Lincoln, Lincoln, 68588, Nebraska, USA

    Andrei Sokolov & Evgeny Y. Tsymbal

  2. Nebraska Center for Materials and Nanoscience, University of Nebraska-Lincoln, Lincoln, 68588, Nebraska, USA

    Andrei Sokolov, Chunjuan Zhang, Evgeny Y. Tsymbal & Jody Redepenning

  3. Department of Chemistry, University of Nebraska-Lincoln, Lincoln, 68588, Nebraska, USA

    Chunjuan Zhang & Jody Redepenning

  4. Institut de Physique et de Chimie des Matériaux de Strasbourg (IPCMS), UMR 7504 CNRS-ULP, Strasbourg, 67034, France

    Bernard Doudin

Authors
  1. Andrei Sokolov
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  2. Chunjuan Zhang
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  3. Evgeny Y. Tsymbal
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  4. Jody Redepenning
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  5. Bernard Doudin
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Correspondence to Bernard Doudin.

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Sokolov, A., Zhang, C., Tsymbal, E. et al. Atomic motion in ferromagnetic break junctions. Nature Nanotech 2, 522–523 (2007). https://doi.org/10.1038/nnano.2007.251b

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