Progress in organic electronics depends on our understanding of the structure–property relationships of organic materials. Resonant scattering of polarized soft X-rays by aromatic carbon bonds has now been used to probe molecular orientation in thin organic semiconductor films down to length scales of 20 nm.
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Mannsfeld, S. In tune with organic semiconductors. Nature Mater 11, 489–490 (2012). https://doi.org/10.1038/nmat3340
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DOI: https://doi.org/10.1038/nmat3340
