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Imperfection-enabled memristive switching in van der Waals materials

Abstract

Memristive devices can offer dynamic behaviour, analogue programmability, and scaling and integration capabilities. As a result, they are of potential use in the development of information processing and storage devices for both conventional and unconventional computing paradigms. Their memristive switching processes originate mainly from the modulation of the number and position of structural defects or compositional impurities—what are commonly referred to as imperfections. While the underlying mechanisms and potential applications of memristors based on traditional bulk materials have been extensively studied, memristors based on van der Waals materials have only been considered more recently. Here we examine imperfection-enabled memristive switching in van der Waals materials. We explore how imperfections—together with the inherent physicochemical properties of the van der Waals materials—create different switching mechanisms, and thus provide a range of opportunities to engineer switching behaviour in memristive devices. We also discuss the challenges involved in terms of material selection, mechanism investigation and switching uniformity control, and consider the potential of van der Waals memristors in system-level implementations of efficient computing technologies.

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Fig. 1: Various imperfections in vdW materials.
Fig. 2: Imperfection-enabled switching mechanisms in vdW memristors.
Fig. 3: Imperfection-related kinetics of the resistive switching processes.
Fig. 4: The development and benchmarks of vdW memristors for various applications.
Fig. 5: Selected special characteristics of vdW memristors.
Fig. 6: Imperfection engineering to improve the performance of vdW memristors.

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Acknowledgements

We thank M.-Y. Tsai for constructive suggestions on the figure optimization. M.L. and Y.-F.L. acknowledge support from the Taiwan Ministry of Science and Technology (grants MOST 109-2112-M-005-013-MY3 and 110-2881-M-005-512-MY2). H.L. and H.W. acknowledge the support of the Army Research Office (grant W911NF1810268) and National Science Foundation (grants 2036359 and 1653870). This work was partially supported by the Air Force Office of Scientific Research (AFOSR) through the Multidisciplinary University Research Initiative (MURI) programme under contract FA9550-19-1-0213 and the United States Air Force Research Laboratory (AFRL) under grants FA8750-18-2-0122 and FA8650-21-C-5405. This work was also partially supported by the National Science Foundation under contract 2023752. The opinions, findings and conclusions or recommendations expressed in this material are those of the authors and do not necessarily reflect the views of AFRL.

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J.J.Y., Y.-F.L. and H.W. conceived the concepts and perspectives. M.L., H.L. and R.Z. worked on literature analysis and data collection. M.L., H.L. and J.J.Y. co-wrote the manuscript. All authors contributed to the discussion of content and reviewed and edited the manuscript. J.J.Y. supervised the project at all stages.

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Correspondence to Chongwu Zhou, Han Wang, Yen-Fu Lin or J. Joshua Yang.

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Li, M., Liu, H., Zhao, R. et al. Imperfection-enabled memristive switching in van der Waals materials. Nat Electron 6, 491–505 (2023). https://doi.org/10.1038/s41928-023-00984-2

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