Four-dimensional scanning transmission electron microscopy is demonstrated to be a powerful technique for interrogating local strain of twisted graphene bilayers, revealing a two-regime lattice reconstruction process below the ‘magic’ angle.
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Haigh, S.J., Gorbachev, R. Magic under the microscope. Nat. Mater. 20, 908–909 (2021). https://doi.org/10.1038/s41563-021-01027-x
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DOI: https://doi.org/10.1038/s41563-021-01027-x