The strength of the magnetic exchange interaction at the buried interface between a magnetic film and a substrate can be measured using spin-polarized electrons scattered from the top surface of the film.
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Slavin, A. Probing buried interfaces. Nature Nanotech 8, 803–805 (2013). https://doi.org/10.1038/nnano.2013.223
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DOI: https://doi.org/10.1038/nnano.2013.223