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Probe microscopy

Images from below the surface

An atomic force microscope can reveal a range of subsurface information about a sample through mechanical excitation of both the sample and the tip.

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Figure 1: In mode-synthesized AFM both the tip (probe) and the sample are mechanically excited by signals that contain a number of known frequency components (modes).


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Garcia, R. Images from below the surface. Nature Nanotech 5, 101–102 (2010).

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