Controlled transfer of single electrons in nanoscale devices allows electric current to be measured in fundamental units of charge and frequency. A new silicon device promises to make these standards more practical.
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References
Cutler, P. H. & Lukas, A. A. (eds) Quantum Metrology and Fundamental Physical Constants (Plenum, New York, 1983).
Fujiwara, A. & Takahashi, Y. Nature 410, 560–562 (2001).
Likharev, K. Proc. IEEE 87, 606–632 (1999).
Likharev, K. & Zorin, A. J. Low Temp. Phys. 59, 347–382 (1985).
Pothier, H. et al. Physica B 169, 573–574 (1991).
Keller, M. W. et al. Appl. Phys. Lett. 69, 1804–1806 (1996).
Averin, D. & Likharev, K. Nanostructures and Mesoscopic Systems (eds Kirk, W. & Reed, M.) 283–295 (Academic, Boston, 1992).
Shilton, J. M. et al. J. Phys. Cond. Mat. 8, L531–L539 (1996).
Barbe, D. F. (ed.) Charge-coupled devices (Springer, Berlin, 1980).
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Likharev, K. Dragging single electrons. Nature 410, 531–533 (2001). https://doi.org/10.1038/35069173
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DOI: https://doi.org/10.1038/35069173
