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Electron microscopy image enhanced

Abstract

One of the biggest obstacles in improving the resolution of the electron microscope has always been the blurring of the image caused by lens aberrations. Here we report a solution to this problem for a medium-voltage electron microscope which gives a stunning enhancement of image quality.

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Figure 1: Diffractogram tableau of the microscope.
Figure 2: Structure images of an epitaxial Si(111) CoSi2 interface demonstrating the production of image artefacts by the effect of con.

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Haider, M., Uhlemann, S., Schwan, E. et al. Electron microscopy image enhanced. Nature 392, 768–769 (1998). https://doi.org/10.1038/33823

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