Abstract
NANNICHI has reported on the formation of silicon whiskers on a sublimating surface1. The specimen had in this case been kept at least 200 h at 1,000°–1,250° C in an initial vacuum of less than 10−8 torr. The whiskers were bent and whirled but their tips were at the height of the original surface. Matter is transported away from the neighbourhood of certain places by thermal erosion so that what is left is thin enough to be called a ‘whisker’.
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LUOVA, P. Formation of Straight Whiskers on Sublimating Single Potassium Chloride Crystal. Nature 209, 286–287 (1966). https://doi.org/10.1038/209286b0
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DOI: https://doi.org/10.1038/209286b0
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