‘Hook Effect’ in the Analysis of X-ray Diffraction Line Profiles

Abstract

IN the analysis of X-ray diffraction line profiles by the Warren and Averbach method¹ a hook has often been observed in the particle size coefficients (A^P_L) versus distance (L) plots. In a recent work² on the analysis of X-ray diffraction line profiles due to cold-worked silver obtained by Geiger counter X-ray diffractometer, no such hook was observed, while in another work³ on the analysis of X-ray diffraction line profiles of cold-worked molybdenum by a photographic method, the hook was quite pronounced. In order to investigate as to why the hook is produced in the photographic method and not in the diffractometer method, the 111 and 222 reflexions of cold-worked aluminium were examined by photographic as well as diffractometer method.