Abstract
ALTHOUGH it provides an elegant and accurate means of determining crystal lattice parameters, the back-reflexion Weissenberg method has not been widely used since it was first proposed in 1937 1,2. Originally a special camera was built for taking back-reflexion Weissenberg photographs, and it is presumably the lack of this instrument in most crystallographic laboratories that accounts for the neglect of the method. However, a special camera is not necessary as an ordinary (and widely available) front-reflexion Weissenberg camera can be easily converted into a back-reflexion instrument. The method of conversion described below applies specifically to front-reflexion Weissenberg cameras of the type described by Buerger2, and may require modification before it can be applied to other designs.
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References
Buerger, M. J., Z. Krist., A, 97, 433 (1937).
Buerger, M. J., “X-Ray Crystallography” (John Wiley and Sons, Inc., New York, 1942).
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HERBSTEIN, F. Precision Determination of Cell Dimensions by the Back-Reflexion Weissenberg Method. Nature 180, 291–292 (1957). https://doi.org/10.1038/180291b0
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DOI: https://doi.org/10.1038/180291b0
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