Abstract
ESTIMATES of the thickness of oxide films on metals have long been made by immersion in an electrolyte and measurement of the capacity of the condenser formed by the film as dielectric1. It has, however, been pointed out by R. Huddle (private communication) that such measurements are liable to error if the film contains cracks, for these permit the electrolyte to approach closer to the metal/oxide interface. This should cause the ‘capacity’ thickness to be less than that derived from measurements of gain of weight, for example. A rise in the capacity of anodized films under condition of breakdown has been reported by Young1.
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References
Young, L., Trans. Farad. Soc., 51, 1250 (1955).
Thomas, D. E., “The Metallurgy of Zirconium”, 608, edit. Lustman and Kerze (McGraw-Hill, 1955).
Charlesby, A., A.E.R.E., M/R 1176 (1953).
Adams, G. B., Maraghini, M., and Van Rysselberghe, P., AECU.2918 (1954).
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WANKLYN, J. Use of Capacity Measurements for the Study of Oxide Films on Metals. Nature 177, 849–850 (1956). https://doi.org/10.1038/177849b0
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DOI: https://doi.org/10.1038/177849b0
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