Abstract
THE light-profile microscope technique, described by Tolansky1, has been adapted by us for the determination of the optical thickness of relatively thick transparent films. A transparent film, bounded by media with refractive indices differing from that of the film, has two reflecting surfaces; when observed with a light-profile microscope these two surfaces produce a double image, from the separation of which it is relatively easy to derive the ratio t/μ in which t is the thickness and μ the refractive index. This is of much value in so far as direct interferometry, using, for example, fringes of equal chromatic order, gives the value μt. The combined methods thus give both μ and t.
This is a preview of subscription content, access via your institution
Access options
Subscribe to this journal
Receive 51 print issues and online access
$199.00 per year
only $3.90 per issue
Buy this article
- Purchase on Springer Link
- Instant access to full article PDF
Prices may be subject to local taxes which are calculated during checkout
Similar content being viewed by others
References
Tolansky, S., Nature, [169, 455 (1952)].
Author information
Authors and Affiliations
Rights and permissions
About this article
Cite this article
RAHBEK, H., OMAR, M. Measurement of the Thickness of Transparent Films with the Light-Profile Microscope. Nature 169, 1008–1009 (1952). https://doi.org/10.1038/1691008b0
Issue Date:
DOI: https://doi.org/10.1038/1691008b0
Comments
By submitting a comment you agree to abide by our Terms and Community Guidelines. If you find something abusive or that does not comply with our terms or guidelines please flag it as inappropriate.