Structure-Factor Graphs for Crystal Analysis

Abstract

WHEN unit cell and space group have been determined in crystal analysis by X-rays, the investigator tests various configurations of the atoms in the unit cell in order to obtain one which explains satisfactorily the observed strength of the diffracted beams with various index-triplets (hkl). For each configuration and each reflection (hkl), an appropriate structure-factor can be calculated by the laws of optical interference. Large structure-factors correspond to strong reflections, and small structure-factors to weak reflections.