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Diffraction imaging of nanocrystalline structures in organic semiconductor molecular thin films
Scanning electron nanobeam diffraction is used to monitor the morphology of organic thin films with nanometre resolution, revealing information on the arrangement of crystalline domains useful for structure–property relationship understanding.
- Ouliana Panova
- , Colin Ophus
- & Andrew M. Minor
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News & Views |
Orbicular origins
The application of imaging techniques prevalent in materials science to the biological process of soft tissue calcification lends new insight into age-related cardiovascular disease.
- Jordan D. Miller