The impact of legal metrology often remains unnoticed in our everyday lives. Pavel Klenovsky, Marc Wouters and Wilfried de Waal instruct us in trade and legal regulations.
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Klenovsky, P., Wouters, M. & de Waal, W. The metrology behind trade. Nat. Phys. 18, 842 (2022). https://doi.org/10.1038/s41567-022-01670-4
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DOI: https://doi.org/10.1038/s41567-022-01670-4
