Trace Analysis by X-Ray Fluorescence using Ion Exchange Resins

Abstract

THE analysis of trace elements in concentrations of a few parts per million, or less, by X-ray fluorescence spectrography has hitherto not been practicable, mainly as a result of the relative weakness of the emitted spectra. Grubb and Zemany¹ have obviated this difficulty by showing that traces of cobalt at levels of 1 µgm./l. may be analysed by first adsorbing the element on to a small piece of cation membrane and irradiating this in an X-ray spectrograph. The long equilibration times involved (16–48 hr.) have, however, precluded the general application of their method in a wider field, particularly in process control, where the time-factor is important.