In the Supplementary Information file originally published with this Article, the details of the beta testers in Supplementary Table S11 were incorrect. These errors have been corrected in the Supplementary Information that now accompanies the Article.
Additional information
The online version of the original article can be found at 10.1038/srep15915
Rights and permissions
This work is licensed under a Creative Commons Attribution 4.0 International License. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in the credit line; if the material is not included under the Creative Commons license, users will need to obtain permission from the license holder to reproduce the material. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/
About this article
Cite this article
Ball, G., Demmerle, J., Kaufmann, R. et al. Erratum: SIMcheck: a Toolbox for Successful Super-resolution Structured Illumination Microscopy. Sci Rep 6, 20754 (2016). https://doi.org/10.1038/srep20754
Published:
DOI: https://doi.org/10.1038/srep20754
Comments
By submitting a comment you agree to abide by our Terms and Community Guidelines. If you find something abusive or that does not comply with our terms or guidelines please flag it as inappropriate.