The ability to extract information from diffuse background signals in ultrafast electron diffraction experiments now enables a direct view of the formation of topological defects during a light-induced phase transition.
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Gierz, I. Spot the defects. Nat. Phys. 20, 8–9 (2024). https://doi.org/10.1038/s41567-023-02285-z
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DOI: https://doi.org/10.1038/s41567-023-02285-z
