ORGANIC SEMICONDUCTORS

Little probe, big data

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Thousands of electron diffraction patterns, collected stepwise by scanning transmission electron microscopy, are synchronized and mined to provide unprecedented maps of the nanostructure of ordered domains in organic electronics films.

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Fig. 1: The 4D-STEM principle.

References

  1. 1.

    Henson, Z. B., Mullen, K. & Bazan, G. C. Nat. Chem. 4, 699–704 (2012).

  2. 2.

    Ouliana Panona, C. O. et al. Nat. Mater. https://doi.org/10.1038/s41563-019-0387-3 (2019).

  3. 3.

    Rodenburg, J. M., McCallum, B. C. & Nellist, P. D. Ultramicroscopy 48, 304–314 (1993).

  4. 4.

    Richter, L. J., DeLongchamp, D. M. & Amassian, A. Chem. Rev. 117, 6332–6366 (2017).

  5. 5.

    Panova, O. et al. Micron 88, 30–36 (2016).

  6. 6.

    van der Poll, T. S., Love, J. A., Nguyen, T.-Q. & Bazan, G. C. Adv. Mater. 24, 3646–3649 (2012).

  7. 7.

    McDowell, C., Abdelsamie, M., Toney, M. F. & Bazan, G. C. Adv. Mater. 30, 1707114 (2018).

  8. 8.

    McCulloch, I. et al. Nat. Mater. 5, 328–333 (2006).

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Correspondence to Gitti L. Frey or Yaron Kauffmann.

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Frey, G.L., Kauffmann, Y. Little probe, big data. Nat. Mater. 18, 776–777 (2019) doi:10.1038/s41563-019-0413-5

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