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Tomographic measurement of dielectric tensors at optical frequency
Measuring three-dimensional dielectric tensors is desired for applications in material and soft matter physics. Here, the authors use a tomographic approach and inversely solve the vectorial wave equation to directly reconstruct dielectric tensors of anisotropic structures.
- Seungwoo Shin
- , Jonghee Eun
- & YongKeun Park
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Imaging material functionality through three-dimensional nanoscale tracking of energy flow
A stroboscopic scattering microscopy approach is developed to image the evolution of carrier distributions in three dimensions and with sub-nanosecond resolution while the carriers propagate in organic and inorganic films.
- Milan Delor
- , Hannah L. Weaver
- & Naomi S. Ginsberg