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Nature Materials 8, 776 - 777 (2009)
doi:10.1038/nmat2538

Scanning electron microscopy: Second best no more

David C. Joy1

  1. David C. Joy is in the Department of Materials Science and Engineering, University of Tennessee, Knoxville, Tennessee 37996, USA, and at The Center for Nanophase Materials Science, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USA.
    e-mail: djoy@utk.edu


Secondary electron imaging in electron microscopy can achieve resolutions that compete with transmission electron microscopy, and allows imaging of both surface and bulk atoms simultaneously.

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