The authors inadvertently omitted Frederik Stöhr, who developed the silicon condenser lens used for the acquisition of data presented in this Article, from the author list. This has now been corrected in both the PDF and HTML versions of the Article.
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The online version of the original article can be found at 10.1038/ncomms7098
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Simons, H., King, A., Ludwig, W. et al. Correction: Corrigendum: Dark-field X-ray microscopy for multiscale structural characterization. Nat Commun 6, 6612 (2015). https://doi.org/10.1038/ncomms7612
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DOI: https://doi.org/10.1038/ncomms7612
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