Transmission electron microscopy

Transmission electron microscopy is a general type of electron microscopy that generates an image of the internal structure of a thin sample using a beam of electrons to achieve much higher spatial resolution than light microscopy.

Latest Research and Reviews

News and Comment

  • News and Views |

    Understanding the surface structure of a catalyst under a reaction environment is challenging, yet necessary. Now, a combination of in situ methods reveals the reversible formation of a surface alloy as the active phase for core–shell Ni–Au nanoparticles during CO2 hydrogenation, which could not be detected by ex situ methods.

    • Rongming Wang
    Nature Catalysis 3, 333-334
  • News and Views |

    Scanning atomic electron tomography measurements reveal the 3D local structure around single dopant atoms in 2D transition metal dichalcogenides, providing essential information to investigate and predict their electronic properties.

    • Angus I. Kirkland
    Nature Materials 19, 827-828
  • News and Views |

    Bending of few-layer graphene leads to interlayer slip, and slipping lowers the bending stiffness. Beyond a critical bending angle, the graphene layers bend like a stack of paper, with a state of superlubricity for interlayer slip.

    • Rui Huang
    Nature Materials 19, 259-260
  • News and Views |

    Thousands of electron diffraction patterns, collected stepwise by scanning transmission electron microscopy, are synchronized and mined to provide unprecedented maps of the nanostructure of ordered domains in organic electronics films.

    • Gitti L. Frey
    •  & Yaron Kauffmann
    Nature Materials 18, 776-777