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Volume 15 Issue 6, June 2021

Scattering invariant modes

The image depicts a simulated intensity distribution of a scattering invariant mode (SIM) propagating through a thin layer of disordered material. The defining property of SIMs is that their output pattern is identical to the case of free space propagation. As shown in this issue, SIMs can be realized experimentally in much thicker materials that scatter light strongly.

See Mosk et al.

IMAGE: Matthias Kühmayer, Vienna University of Technology (TU Wien) COVER DESIGN: Bethany Vukomanovic.

Obituary

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News & Views

  • The successful demonstration of two-stage acceleration driven by terahertz pulses bodes well for the future development of compact, efficient particle accelerators.

    • Emilio A. Nanni
    News & Views
  • A new way to define the shape of tiny light-emitting semiconductor pixels provides a means to fabricate arrays of InGaN blue micro-LEDs with a resolution as high as 8,500 pixels per inch.

    • Ulrich T. Schwarz
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  • Tunnelling currents inside plasmonic nanostructures are fast enough to gain direct access to the oscillating electric field of near-infrared and visible light, opening up exciting routes towards attosecond metrology of light–matter interaction and unique approaches to spectroscopy.

    • Nicholas Karpowicz
    News & Views
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Review Articles

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Letters

  • The concept of scattering invariant modes is introduced to produce the same transmitted field profiles through a multiple scattering sample and a reference medium. Their correlations with the ballistic light can be used to improve imaging inside scattering materials.

    • Pritam Pai
    • Jeroen Bosch
    • Allard P. Mosk
    Letter
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