03-2019-IMT PhD Position: Characterization of surfaces at the micro and nanoscale, using correlated data from vertical scanning interferometry, atomic force microscopy, and ToF-SIMS

Karlsruhe Institute of Technology (KIT) - KIT - Helmholtz Association

Karlsruhe, Germany

Work group:

Institute of Microstructure Technology (IMT)

Area of research:

PHD Thesis

Job description:

The aim of this PhD work is the establishment of a correlative analysis method for the characterization of structured surfaces, which are composed of layers of different materials. The measurement methods aims to obtain a clear correlation between topography, mechanical properties and chemical behavior at sub-micrometer level. This information is the basis for sustainably optimizing the surface layers to meet the requirements of applications. The information is generated from data resulting from the combination of Vertical Scanning Interferometry, Atomic Force Microscopy and ToF-SIMS. This requires both a spatial correlation in the measurement and a corresponding data correlation.

University degree (Diploma (UNI) / Master) in physics, mechanical engineering, micro technology or electrical engineeringBasic knowledge of physics and mechanicsExperience in micro fabrication and topological characterization methodsAnalytical skills to solve physical and technical issuesInterest in Computer Science and Materials ScienceGood English knowledgeContract duration

limited to 3 years

Application up to


Contact person in line-management

For further information, please contact Prof. Dr. Korvink, e-mail: jan.korvink@kit.edu, phone 0721 608-22740

Please apply via recruiter’s website.

Quote Reference: Helmholtz-2372