Area of research:
Scientific / postdoctoral posts
The scientific aim of the activity is a basic understanding of growth processes in semiconductor nanostructures as a function of growth conditions. In particular, your duties include the development of in-situ capable X-ray scattering measurement routines and their implementation/integration into suitable synchrotron radiation measuring stations and in-situ growth chambers. Your area of responsibility is the ex-situ and in-situ characterization of the growth processes of semiconductor nanostructures using X-ray scattering methods using synchrotron radiation, focusing on the application and further development of so-called reciprocal space mapping in a wide variety of scattering geometries such as GID, GISAXS and CDI. In addition, you will be actively involved in the advancement and coordination of scientific research collaborations and you will take over the acquisition and coordination of national and international research projects in the field of modern X-ray physics and nanosciences.