As the world of connected devices continues to expand, the need to develop more secure technology becomes increasingly relevant.
Volume 1 Issue 10, October 2018
Books & Arts
News & Views
This Review Article examines state-of-the-art metrology methods for integrated circuits and highlights how new integrated circuit device design and industry requirements affect lithography options and consequently metrology requirements.
A hafnium oxide memristor crossbar array integrated with transistors can provide a provable key destruction scheme in which unique physical fingerprints are extracted by comparing the conductance of neighbouring memristors, and can only be revealed if a digital key stored on the same array is erased.
A free-standing top contact design reduces the thermomechanical stress in microthermoelectric coolers, resulting in improved reliability and cooling stability.
A comparison between the use of directed self-assembly and conventional patterning methods in the fabrication of 7 nm node FinFETs shows similar device performance, suggesting directed self-assembly could offer a simplified patterning technique for future semiconductor technology nodes.