Table 1 Sample characteristics (film thickness (tN), substrate, growth temperature (Tg), resistivity (ρ)), input charge current density (jc) and observed transverse spin polarization (Pcosϕ)

From: Current-induced spin polarization on metal surfaces probed by spin-polarized positron beam

Sample tN (nm) Substrate Tg (°C) ρ (µΩcm) jc (A/cm2) Pcosϕ (%)
Au(001) 25 Fe(001)/MgO(001) 27 16 2.4 × 105 Null
Cu 25 MgO(001) 27 8 2.4 × 105 Null
Pt(111) 25 Al2O3(0001) 600 21 2.0 × 105 11 ± 2
Pd(111) 25 Al2O3(0001) 500 27 2.4 × 105 8 ± 2
α-Ta 10 Al2O3(0001) 600 43 2.5 × 105 −12 ± 3
β-Ta 10 SiO2/Si(001) 27 128 5.0 × 104 −7 ± 2
α-W 10 Al2O3(0001) 600 28 1.0 × 105 −6 ± 2
βα-W 10 SiO2/Si(001) 27 110 1.0 × 105 −9 ± 3