Abstract
The integration of two-dimensional semiconductors and arbitrary materials or architectures offers the possibility to enhance the functionality of a material and improve device performance. However, the traditional vertical epitaxy process requires a lattice-matched planar substrate, which limits the scope of heterogeneous integration. Bottom-up heteroepitaxial growth of single-crystal thin films on arbitrary materials with a large lattice mismatch typically results in highly defective interfaces. Here we report a general synthesis route for heteroepitaxial growth of semiconducting 2H-MoTe2 films on arbitrary substrates with different crystal symmetries, lattice constants and three-dimensional architectures, which overcomes the limitation of the substrate. The in-plane two-dimensional epitaxy process through phase transition enables the direct synthesis of single-crystal semiconducting 2H-MoTe2 films on arbitrary single-crystal substrates (including silicon, GaN, 4H-SiC, sapphire, SrTiO3 and Gd3Ga5O12) and three-dimensional architectures without the limitation of lattice matching and a planar surface. This heteroepitaxial method provides a way of heterogeneous integration of semiconducting 2H-MoTe2 films with other functional materials or architectures for the fabrication of integrated devices.
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Data availability
The data that support the findings of this study are available at https://doi.org/10.6084/m9.figshare.20071661.v1.
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Acknowledgements
This work was supported by the National Key R&D Program of China (grant nos. 2017YFA0206301 and 2018YFA0306900 to Y.Y., no. 2018YFA0305800 to W.Z. and no. 2018YFA0703700 to J.H.), the Key Research Program of Frontier Sciences, CAS (grant nos. ZDBS-LY-JSC015 to Y.Y. and QYZDB-SSW-JSC019 to W.Z.), the National Natural Science Foundation of China (grant no. 11974024 to J.C., and nos. 51872285 and 61875001 to A.W.), the Research Program of the Chinese Academy of Science (grant no. XDB33010400 to J.C.), the China Postdoctoral Science Foundation (grant no. 2020TQ0015 to X.X.), the Beijing Natural Science Foundation (grant no. JQ21018 to Y.Y.), the Beijing Outstanding Young Scientist Program (grant no. BJJWZYJH01201914430039 to W.Z.) and the Fundamental Research Funds for the Central Universities (grant no. E1E40209 to R.G.). We are grateful for the computational resources provided by the TianHe-1A supercomputer at the Shanghai Supercomputer Center, the Computing Platform of Peking University and the Songshan Lake Materials Lab. We thank the Integrated Circuit Advanced Process Center of IMECAS for its efforts in fabrication of fin architecture.
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Y.Y. and Y.P. conceived the project, designed the experiments and wrote the manuscript. Y.P. and X.X. prepared the samples, fabricated the devices and performed Raman, EBSD and AFM characterizations, as well as electrical measurements. R.G. performed STEM characterizations under the supervision of W.Z.. S.L. conducted the DFT calculations under the supervision of J.C. R.G., W.Z., J.H., A.W. and X.X. provided useful analysis and discussions. W.X. performed magnetron sputtering. Y.L. helped set up the CVD growth system. N.T. supplied the single-crystal substrates. H.Y. provided the 3D fin architectures. Y.Y. supervised the project. All of the authors contributed to discussions.
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Pan, Y., Guzman, R., Li, S. et al. Heteroepitaxy of semiconducting 2H-MoTe2 thin films on arbitrary surfaces for large-scale heterogeneous integration. Nat. Synth 1, 701–708 (2022). https://doi.org/10.1038/s44160-022-00134-0
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DOI: https://doi.org/10.1038/s44160-022-00134-0
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