Fig. 5 | npj 2D Materials and Applications

Fig. 5

From: In situ control of graphene ripples and strain in the electron microscope

Fig. 5

Effect of stretching the sample carrier on the out-of-plane corrugation and strain in suspended graphene. a Changes in the maximum (major axis) and minimum γrms (minor axis) in graphene during the experiment (γrms, right y-axis), as estimated from the σ/α values (left y-axis) measured from diffraction spots. Error bars show the standard errors from the fits to the experimental data and horizontal gray lines are guides to the eye. b Apparent strain in real space in two orthogonal directions, as estimated from the diffraction patterns at zero tilt (α = 0) during the experiment. Initial axes lengths A0 and B0 are estimated as the averages of the first 15 values for each data set, and the lines marked with labels 1–3 are fits to the corresponding data points with following slopes: (1) −0.57 ± 0.05, (2) 0.46 ± 0.03, and (3) 2.02 ± 0.09 (uncertainties are standard errors of the fits). The x-axis values (ΔG/G0) indicate the relative change in the size of the gap in the sample holder over which the sample was suspended

Back to article page