Fig. 4 | npj 2D Materials and Applications

Fig. 4

From: In situ control of graphene ripples and strain in the electron microscope

Fig. 4

Evolution of the diffraction pattern and individual diffraction spots during the experiment. ac Diffraction pattern recorded at different stages of the experiment: a at the beginning, b towards the end, and c at the end. All shown patterns were recorded at sample tilt α = 21°. The dashed lines show the approximate tilt axis and the overlaid hexagons highlight the first set of diffraction peaks. The panels on the right show a zoom-in of the indicated diffraction spots in false color. d Orientation of the ellipse fitted to the diffraction patterns (Θ) and that of the diffraction spots (θ) during the experiment. e Ellipticity of the diffraction patterns (B/A, right y-axis) and spots (b/a, left y-axis). Standard errors from the fits to the measured values are contained within the markers. All diffraction pattern values are for α = 0° and spot values for α = 21°. In d and e, the values corresponding to the diffraction patterns shown in ac are marked with corresponding labels. The x-axis values (ΔG/G0) indicate the relative change in the size of the gap in the sample carrier over which the sample was suspended

Back to article page