Fig. 3 | npj 2D Materials and Applications

Fig. 3

From: In situ control of graphene ripples and strain in the electron microscope

Fig. 3

Experimental setup. a Sample attached to two Al plates, mounted onto the tensile testing TEM holder. During the experiment, one of the Al plates is pulled step-by-step in the direction of the arrow, leading to stretching of the sample. b TEM image of the sample area between the two areas attached to the plates with an adhesive. The scale bar is 100 μm. c TEM image of a square within the Au TEM sample carrier, showing the sample-supporting amorphous carbon film with several holes. d TEM image of mono-layer graphene suspended over a hole in the support film. e TEM image of the sample area after the experiment showing a fractured sample carrier

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