Fig. 2 | npj 2D Materials and Applications

Fig. 2

From: In situ control of graphene ripples and strain in the electron microscope

Fig. 2

Effect of varying surface inclination on the graphene diffraction pattern. Flat sample has parallel lattice normals throughout the sample a, which leads to sharp rods in the reciprocal space b giving the same width for diffraction spots regardless of the sample tilt. In contrast, a corrugated sample c (here with root mean square inclination of γrms = 7.8°) exhibits cone-like volumes in the reciprocal space d that lead to increasing diffraction spot sizes for higher sample tilts. e Relationship between the diffraction spot size (σ) and the sample tilt (α) for simulated corrugated graphene structures with varying values of γrms. The solid line is a fit to the data points

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