Figure 4 | Scientific Reports

Figure 4

From: Analogue pattern recognition with stochastic switching binary CMOS-integrated memristive devices

Figure 4

Retention of polycrystalline and amorphous devices. Plots (a, c) show the retention of the HRS for the polycrystalline and amorphous devices, respectively. In (b, d) the retention of the LRS is depicted for the polycrystalline and amorphous devices, respectively. The retention is measured for a temperature of 125 °C. Measurements are done with 128 devices for each technology with 10 µs read-out times. The current resolution for (a, b) is higher than for (c, d). The more quantised data for the amorphous devices do not show a more quantised retention behaviour.

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