Figure 2 | Scientific Reports

Figure 2

From: Thermally stable amorphous tantalum yttrium oxide with low IR absorption for magnetophotonic devices

Figure 2

Crystalline states of the samples. XRD patterns of the annealed (a) aTYO films at 14% Y and (b) Ta2O5 films. Annealing was performed for 30 min in residual air at a pressure of 15 Pa (111 mTorr) and temperatures of 650 °C, 700 °C, 850 °C, or 900 °C. The white triangles indicate the diffraction peaks of Ta2O5 47, and the white circle indicates the diffraction peak of Y2O3 54.

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