Extended Data Fig. 2: Electrical schematic showing the details of the penetration field capacitance measurements. | Nature

Extended Data Fig. 2: Electrical schematic showing the details of the penetration field capacitance measurements.

From: Spin–orbit-driven band inversion in bilayer graphene by the van der Waals proximity effect

Extended Data Fig. 2

The components enclosed in the red dashed box are inside the cryostat, held at base temperature. Voltages are applied to Vtop and Vsamp (at a fixed Vgate) in order to adjust charge density n = ctvt + cbvb and displacement field D = (ctvt − cbvb)/(2ϵ0). See Methods for details.

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