Extended Data Fig. 1: Position-averaged diffraction pattern of the 4D dataset from monolayer MoS2. | Nature

Extended Data Fig. 1: Position-averaged diffraction pattern of the 4D dataset from monolayer MoS2.

From: Electron ptychography of 2D materials to deep sub-ångström resolution

Extended Data Fig. 1

a, Position-averaged convergent beam electron diffraction (CBED) pattern from the 4D dataset from monolayer MoS2. b, Radially averaged intensity distribution (on a logarithmic scale) of the CBED pattern, showing the dynamic range spanned by the scattering distribution.

Back to article page