Extended Data Fig. 7: Effect of dose and cutoff angles on ptychographic reconstructions of monolayer MoS2 using simulated diffraction patterns. | Nature

Extended Data Fig. 7: Effect of dose and cutoff angles on ptychographic reconstructions of monolayer MoS2 using simulated diffraction patterns.

From: Electron ptychography of 2D materials to deep sub-ångström resolution

Extended Data Fig. 7

At high beam current, the resolution of the ptychography reconstruction is fundamentally determined by the collection angle of the detector. As the beam current decreases, the resolution becomes dose-limited and noise artefacts start to appear in the ePIE reconstruction. Beam energy, 80 keV; aperture size (α), 21.4 mrad.