Extended Data Fig. 6: Influence of scanning drift and contamination. | Nature

Extended Data Fig. 6: Influence of scanning drift and contamination.

From: Electron ptychography of 2D materials to deep sub-ångström resolution

Extended Data Fig. 6

ac, ADF image (a), iCoM image (b) and phase of transmission reconstructed by full-field ptychography (c) using 128 × 128 diffraction patterns, covering a field of view of 2.7 nm × 2.7 nm. The ADF and iCoM reconstructions both suffer from stripe artefacts and large contrast variations. In the ptychographic reconstruction, scanning drift distorts and blurs reconstructed atoms in the vicinity of the scan distortion, but the overall resolution away from the distortion remains higher than the other imaging modes.

Back to article page