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Silicon quantum dots

Spatial correlations of charge noise captured

Measurements of two neighbouring silicon-based qubits show that the charge noise they each experience is correlated, suggesting a common origin. Understanding these correlations is crucial for performing error correction in these systems.

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Fig. 1: Two gate-defined quantum dot spin qubits interacting with sources of charge noise.

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Correspondence to Łukasz Cywiński.

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Cywiński, Ł. Spatial correlations of charge noise captured. Nat. Phys. 19, 1751–1752 (2023). https://doi.org/10.1038/s41567-023-02189-y

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