Abstract
Hong–Ou–Mandel (HOM) interference—the bunching of indistinguishable photons at a beamsplitter—is a staple of quantum optics and lies at the heart of many quantum sensing approaches and recent optical quantum computers. Here we report a full-field, scan-free quantum imaging technique that exploits HOM interference to reconstruct the surface depth profile of transparent samples. We demonstrate the ability to retrieve images with micrometre-scale depth features with photon flux as small as seven photon pairs per frame. Using a single-photon avalanche diode camera, we measure both bunched and anti-bunched photon-pair distributions at the output of an HOM interferometer, which are combined to provide a lower-noise image of the sample. This approach demonstrates the possibility of HOM microscopy as a tool for the label-free imaging of transparent samples in the very low photon regime.
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Data availability
The experimental data that support the findings presented here are available from https://doi.org/10.5525/gla.researchdata.1241.
Code availability
The codes that support the findings presented here are available from https://doi.org/10.5525/gla.researchdata.1241.
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Acknowledgements
We thank M. Cromb for fruitful discussions on the interpretation of the results. We acknowledge financial support from the UK Engineering and Physical Sciences Research Council (grants EP/R030413/1, EP/M01326X/1 and EP/R030081/1) and from the European Union’s Horizon 2020 research and innovation programme under grant agreement no. 801060. D.F. acknowledges support from the Royal Academy of Engineering Chair in Emerging Technologies programme. H.D. acknowledges support from the European Union’s Horizon 2020 research and innovation programme under the Marie Skłodowska-Curie grant agreement no. 840958. N.W. acknowledges support from the Royal Commission for the Exhibition of 1851.
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D.F. conceived the concept and supervised the work. B.N., H.D., A.L. and D.F. conceived and discussed the experimental setup. B.N. performed the experiment. Y.D.S. microfabricated the etched sample. D.B., N.W. and E.M.G. applied noise reduction approaches. All the authors contributed to the analysis of the results and the manuscript.
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Ndagano, B., Defienne, H., Branford, D. et al. Quantum microscopy based on Hong–Ou–Mandel interference. Nat. Photon. 16, 384–389 (2022). https://doi.org/10.1038/s41566-022-00980-6
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DOI: https://doi.org/10.1038/s41566-022-00980-6
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